The EDX 4500H X fluorescence spectrometer utilizes the XRF detection principle to achieve rapid, accurate, and non-destructive analysis of various elemental components.
The main feature of this instrument is the use of an intelligent vacuum system, which can effectively excite light elements such as Si, P, S, Al, Mg, etc. The XRF technology can accurately analyze high content elements such as Cr, Ni, Mo, etc. It plays a role in controlling the smelting process with short testing time, greatly improving detection efficiency and work efficiency.
In addition, it is also widely used in alloy analysis, total element analysis, and harmful element detection applications.
Performance characteristics
Efficient thin window X-ray tube
Digital multi-channel technology makes testing faster, with a count rate of up to 100000 CPS and high accuracy. Good performance in alloy testing
SDD silicon drift detector, with good energy linearity, energy resolution, and spectral characteristics, and high peak to back ratio
Low energy X-ray excitation of the element under test, with good excitation effect on light elements such as Si and P
Intelligent vacuum pumping system, shielding the influence of air, greatly expanding the scope of testing
The automatic spectrum stabilization device ensures the consistency of instrument operation
Electronic circuit units with high signal-to-noise ratio
Automatically switch collimators and filters for different samples, eliminating the tedious manual operation
Spectral decomposition technology decomposes spectral peaks, ensuring that the test results of the measured elements have equal analytical accuracy
The multi parameter linear regression method significantly suppresses the absorption and enhancement effects between elements
Built in high-definition camera

The LCD screen display makes important parameters of the instrument (tube pressure, tube flow, vacuum degree) clear at a glance

technical parameter
Product model: EDX 4500H
Product Name: X-ray Fluorescence Spectrometer
Measurement element range: from sodium (Na) to uranium (U)
Range of element content analysis: Ppm -99.99% (different elements have different analysis ranges)
Simultaneous analysis of elements: dozens of elements can be measured at once
Measurement time: 30-200 seconds
The energy resolution of the detector is 145 ± 5eV
Pipe pressure: 5KV-50KV
Pipe flow: 50 μ A-1000 μ A
Measurement object status: powder, solid, liquid
Input voltage: AC 110V/220V
Environmental temperature: 15 ℃ -30 ℃
Environmental humidity: 35% -70%
Sample cavity volume: 320mm × 100mm
Dimensions: 660mm × 510mm × 350mm

Weight: 65Kg

Standard configuration
Efficient ultra-thin window X-ray tube
SDD silicon drift detector
Digital multi-channel technology
Optical path enhancement system
High signal-to-noise ratio electronic circuit unit
Built in high-definition camera
Automatic switching collimator and filter
Automatic spectrum stabilization device
Triple security protection mode
Reliable overall steel frame structure
90mm × 70mm status display LCD screen
Vacuum pump
application area
Alloy testing, full element analysis, hazardous element testing (RoHS, halogen)